This paper proposes a new concept for the evaluation of fatigue damage parameters.It is suggested that evaluation of fatigue damage may not necessarily be confined to Womenswear a single plane, i.e., a critical plane.Rather, it is suggested here that the culmination of fatigue crack on a particular plane(s) is due to the contributions of damage on
Verification of ESD safety on full chip level is a major challenge for IC design.Especially phenomena with their origin in the overall product setup are posing a hurdle on the way to ESD safe products.For stress according to the Charged Device Model (CDM), a stumbling stone for a simulation based Optics analysis is the complex current distribution
Background: Prolonged university closures and social distancing-imposed measures due to the COVID-19 pandemic obliged students to at-home learning with online lectures and educational programs promoting potential social isolation, loneliness, hopelessness, and episodes of clinical decompensation.Methods: A web-based cross-sectional survey was carri